Caltech - GPS Division Analytical Facility

High Resolution Analytical Scanning Electron Microscope:

from Nano-imaging to Chemical and Structural Analyses

ZEISS 1550VP Field Emission SEM - Oxford EDS - HKL EBSD

  
 


Information for SEM Users   |   Manual  

Instruments    

Imaging capabilities   

Chemical analysis - EDS         

Structural analysis - EBSD                  


Image Album


High resolution image revealing nano-crystals covering up Fe oxide particle. (c) Chi Ma


Low voltage SE image (obtaining at 300 V) showing surface details of kaolinite plates. (c) Chi Ma

Cathodoluminescence (CL) image of benitoite. (c) Chi Ma

STEM image of borosilicate fibers. (c) Chi Ma

Electron backscatter diffraction pattern of silicon.


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